AKHTER, M. O.; M. AMIN, N.; RASHID MASUD, A. PVT Analysis and Behavioral Modeling of Doherty and Envelope Tracking RF ULP Power Amplifiers using 65 nm CMOS Technology. Sir Syed University Research Journal of Engineering & Technology, Pakistan, v. 13, n. 2, p. 67–73, 2023. DOI: 10.33317/ssurj.589. Disponível em: https://sirsyeduniversity.edu.pk/ssurj/rj/index.php/ssurj/article/view/589. Acesso em: 10 may. 2024.